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      A compact dual-crystal modulated birefringence-measurement system for microgravity applications

      , , ,
      Measurement Science and Technology
      IOP Publishing

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          Fast polarization modulated ellipsometer using a microprocessor system for digital Fourier analysis

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            Measurement of extensional viscosity of polymer solutions

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              Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal.

              R Azzam (1978)
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                Author and article information

                Journal
                Measurement Science and Technology
                Meas. Sci. Technol.
                IOP Publishing
                0957-0233
                1361-6501
                October 04 1999
                October 01 1999
                September 17 1999
                : 10
                : 10
                : 946-955
                Article
                10.1088/0957-0233/10/10/315
                90babd0a-1faf-4758-a09d-68f361c27831
                © 1999
                History

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