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      Response Time Effort: A New Measure of Examinee Motivation in Computer-Based Tests

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      Applied Measurement in Education
      Informa UK Limited

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          Low Examinee Effort in Low-Stakes Assessment: Problems and Potential Solutions

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            Comparing the Aberrant Response Detection Performance of Thirty-Six Person-Fit Statistics

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              Diagnosing item score patterns on a test using item response theory-based person-fit statistics.

              Rob Meijer (2003)
              Person-fit statistics have been proposed to investigate the fit of an item score pattern to an item response theory (IRT) model. The author investigated how these statistics can be used to detect different types of misfit. Intelligence test data were analyzed using person-fit statistics in the context of the G. Rasch (1960) model and R. J. Mokken's (1971, 1997) IRT models. The effect of the choice of an IRT model to detect misfitting item score patterns and the usefulness of person-fit statisticsfor diagnosis of misfit are discussed. Results showed that different types of person-fit statistics can be used to detect different kinds of person misfit. Parametric person-fit statistics had more power than nonparametric person-fit statistics.
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                Author and article information

                Journal
                Applied Measurement in Education
                Applied Measurement in Education
                Informa UK Limited
                0895-7347
                1532-4818
                April 2005
                April 2005
                : 18
                : 2
                : 163-183
                Article
                10.1207/s15324818ame1802_2
                92af9720-198a-4010-a44f-79aa85efa94e
                © 2005
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