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      Structural characterization of niobium oxide thin films grown on SrTiO3(111) and (La,Sr)(Al,Ta)O3(111) substrates

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      Journal of Applied Physics

      AIP Publishing

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          EMS - a software package for electron diffraction analysis and HREM image simulation in materials science

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            Advanced Computing in Electron Microscopy

             Earl Kirkland (2010)
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              Universal Ti-rich termination of atomically flat SrTiO3 (001), (110), and (111) surfaces

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                December 28 2016
                December 28 2016
                : 120
                : 24
                : 245302
                Article
                10.1063/1.4972830
                9397c25f-4248-4320-8433-09080bf52dad
                © 2016
                Product

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