Structural characterization of niobium oxide thin films grown on SrTiO3(111) and (La,Sr)(Al,Ta)O3(111) substrates

Smith, David J.; Dhamdhere, Ajit R.; Hadamek, Tobias; Posadas, Agham B; Demkov, Alexander A

doi:10.1063/1.4972830

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Structural characterization of niobium oxide thin films grown on SrTiO3(111) and (La,Sr)(Al,Ta)O3(111) substrates

Author(s): Ajit R. Dhamdhere , Tobias Hadamek , Agham B. Posadas , Alexander A. Demkov , David J. Smith

Publication date Created: December 28 2016

Publication date (Print): December 28 2016

Journal: Journal of Applied Physics

Publisher: AIP Publishing

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EMS - a software package for electron diffraction analysis and HREM image simulation in materials science

P.A. Stadelmann (1987)

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Advanced Computing in Electron Microscopy

Earl Kirkland (2010)

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Universal Ti-rich termination of atomically flat SrTiO3 (001), (110), and (111) surfaces

W Siemons, I. K. Yang, R. Ramesh … (2011)

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Journal

Title: Journal of Applied Physics

Abbreviated Title: Journal of Applied Physics

Publisher: AIP Publishing

ISSN (Print): 0021-8979

ISSN (Electronic): 1089-7550

Publication date Created: December 28 2016

Publication date (Print): December 28 2016

Volume: 120

Issue: 24

Page: 245302

Article

DOI: 10.1063/1.4972830

SO-VID: 9397c25f-4248-4320-8433-09080bf52dad

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Structural characterization of niobium oxide thin films grown on SrTiO3(111) and (La,Sr)(Al,Ta)O3(111) substrates

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Fracture and Structural Integrity

Most cited references 25

EMS - a software package for electron diffraction analysis and HREM image simulation in materials science

Advanced Computing in Electron Microscopy

Universal Ti-rich termination of atomically flat SrTiO3 (001), (110), and (111) surfaces

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