The use of least squares for XPS peak parameters estimation. Part 3. Multicollinearity, ill-conditioning and constraint-induced bias

Leclerc, Gervais; Pireaux, J.J.

doi:10.1016/0368-2048(94)02280-1

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The use of least squares for XPS peak parameters estimation. Part 3. Multicollinearity, ill-conditioning and constraint-induced bias

Author(s): Gervais Leclerc , J.J. Pireaux

Publication date Created: March 1995

Publication date (Print): March 1995

Journal: Journal of Electron Spectroscopy and Related Phenomena

Publisher: Elsevier BV

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Title: Journal of Electron Spectroscopy and Related Phenomena

Abbreviated Title: Journal of Electron Spectroscopy and Related Phenomena

Publisher: Elsevier BV

ISSN (Print): 03682048

Publication date Created: March 1995

Publication date (Print): March 1995

Volume: 71

Issue: 2

Pages: 179-190

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DOI: 10.1016/0368-2048(94)02280-1

SO-VID: 953e3f78-f6ea-443c-9c2b-7ff0930ae9a9

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https://www.elsevier.com/tdm/userlicense/1.0/

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