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      Dislocation Effects on the Diffraction Line Profiles from Nanocrystalline Domains

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      Metallurgical and Materials Transactions A
      Springer Nature America, Inc

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          X-ray line broadening from filed aluminium and wolfram

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            Embedded-atom-method functions for the fcc metals Cu, Ag, Au, Ni, Pd, Pt, and their alloys

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              Zerstreuung von Röntgenstrahlen

              P DEBYE (1915)
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                Author and article information

                Journal
                Metallurgical and Materials Transactions A
                Metall and Mat Trans A
                Springer Nature America, Inc
                1073-5623
                1543-1940
                December 2016
                March 28 2015
                December 2016
                : 47
                : 12
                : 5722-5732
                Article
                10.1007/s11661-015-2863-y
                95c23d27-3d02-4460-8a7f-2d5c5c1e82e9
                © 2016

                http://www.springer.com/tdm

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