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Electron transport across aluminum/ultrathin silicon oxide/phosphorus implanted silicon barriers

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      Most cited references 12

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      Field and thermionic-field emission in Schottky barriers

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        Studies of tunnel MOS diodes I. Interface effects in silicon Schottky diodes

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          Photoemission of Electrons from Silicon into Silicon Dioxide

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            Author and article information

            Journal
            Journal of Applied Physics
            Journal of Applied Physics
            AIP Publishing
            0021-8979
            1089-7550
            September 1980
            September 1980
            : 51
            : 9
            : 4913-4918
            10.1063/1.328364
            © 1980
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