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      Electron transport across aluminum/ultrathin silicon oxide/phosphorus implanted silicon barriers

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          Most cited references 12

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          Field and thermionic-field emission in Schottky barriers

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            Studies of tunnel MOS diodes I. Interface effects in silicon Schottky diodes

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              Photoemission of Electrons from Silicon into Silicon Dioxide

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                September 1980
                September 1980
                : 51
                : 9
                : 4913-4918
                10.1063/1.328364
                © 1980
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