Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction

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Journal

Journal ID (publisher-id): applab

Title: Microscopy and Microanalysis

Abbreviated Title: Microsc. Microanal.

Publisher: Cambridge University Press (CUP)

ISSN (Print): 1431-9276

ISSN (Electronic): 1435-8115

Publication date Created: August 2006

Publication date (Electronic): July 31 2006

Publication date (Print): August 2006

Volume: 12

Issue: S02

Pages: 66-67

Article

DOI: 10.1017/S1431927606065883

SO-VID: 96d271af-e9c6-4d60-83ac-b1a137dea155

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