Blog
About

4
views
0
recommends
+1 Recommend
1 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction

        , ,

      Microscopy and Microanalysis

      Cambridge University Press (CUP)

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Author and article information

          Journal
          applab
          Microscopy and Microanalysis
          Microsc. Microanal.
          Cambridge University Press (CUP)
          1431-9276
          1435-8115
          August 2006
          July 31 2006
          August 2006
          : 12
          : S02
          : 66-67
          10.1017/S1431927606065883
          © 2006

          Comments

          Comment on this article