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      Magnetic force microscopy: General principles and application to longitudinal recording media

      Author(s): , , , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Atomic Force Microscope

          G. Binnig, C Quate, Andreas Gerber (1987)
          Article 0 comments Cited 2182 times – based on 0 reviews     Review now
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            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

            Y Martin, C Williams, H. Wickramasinghe (1987)
            Article 0 comments Cited 325 times – based on 0 reviews     Review now
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              Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

              Y Martin, H. Wickramasinghe (1987)
              Article 0 comments Cited 288 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: August 1990
                Publication date (Print): August 1990
                Volume: 68
                Issue: 3
                Pages: 1169-1183
                Article
                DOI: 10.1063/1.346713
                SO-VID: 985c8e3a-d4b2-451e-bbc8-737011e19f8e
                Copyright © © 1990
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