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      • Record: found
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      MicroRaman study of crystallographic defects in SiC crystals

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: Solid-State Electronics
      Publisher: Elsevier BV

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          Journal
          Title: Solid-State Electronics
          Abbreviated Title: Solid-State Electronics
          Publisher: Elsevier BV
          ISSN (Print): 00381101
          Publication date Created: December 1998
          Publication date (Print): December 1998
          Volume: 42
          Issue: 12
          Pages: 2309-2314
          Article
          DOI: 10.1016/S0038-1101(98)00231-7
          SO-VID: 99f4e9c5-a58d-4f69-afbb-6300ccb2d7ff
          Copyright © © 1998
          License:

          https://www.elsevier.com/tdm/userlicense/1.0/

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