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      MicroRaman study of crystallographic defects in SiC crystals

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      Solid-State Electronics

      Elsevier BV

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          Author and article information

          Journal
          Solid-State Electronics
          Solid-State Electronics
          Elsevier BV
          00381101
          December 1998
          December 1998
          : 42
          : 12
          : 2309-2314
          Article
          10.1016/S0038-1101(98)00231-7
          © 1998

          https://www.elsevier.com/tdm/userlicense/1.0/

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