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      A review of thermal rectification observations and models in solid materials

      Author(s): ,
      Publication date Created:
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      Journal: International Journal of Thermal Sciences
      Publisher: Elsevier BV

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          Thermal boundary resistance

          E. T. Swartz, R. Pohl (1989)
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            Measuring Thermal and Thermoelectric Properties of One-Dimensional Nanostructures Using a Microfabricated Device

            Zhen Yao, Arunava Majumdar, Philip Kim … (2003)
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              Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures

              Arunava Majumdar, Kenneth Goodson, David G Cahill (2002)
              Article 0 comments Cited 147 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: International Journal of Thermal Sciences
                Abbreviated Title: International Journal of Thermal Sciences
                Publisher: Elsevier BV
                ISSN (Print): 12900729
                Publication date Created: May 2011
                Publication date (Print): May 2011
                Volume: 50
                Issue: 5
                Pages: 648-662
                Article
                DOI: 10.1016/j.ijthermalsci.2010.12.004
                SO-VID: 9a6dfdd3-1f75-4529-bc2f-8e0ff73c0d67
                Copyright © © 2011
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                http://www.elsevier.com/tdm/userlicense/1.0/

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