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      Gallium arsenide and other compound semiconductors on silicon

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          Most cited references 151

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          Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures

           J. C. Bean,  R. People (1985)
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            Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBE

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              Piezo-Electroreflectance in Ge, GaAs, and Si

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                October 1990
                October 1990
                : 68
                : 7
                : R31-R58
                10.1063/1.346284
                © 1990
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