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      Gallium arsenide and other compound semiconductors on silicon

      Author(s): , , , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures

          J. C. Bean, R. People (1985)
          Article 0 comments Cited 380 times – based on 0 reviews     Review now
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            Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBE

            Akitoshi Ishizaka (1986)
            Article 0 comments Cited 338 times – based on 0 reviews     Review now
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              Piezo-Electroreflectance in Ge, GaAs, and Si

              Fred Pollak, Manuel Cardona (1968)
              Article 0 comments Cited 324 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: October 1990
                Publication date (Print): October 1990
                Volume: 68
                Issue: 7
                Pages: R31-R58
                Article
                DOI: 10.1063/1.346284
                SO-VID: 9b81dd69-3929-4f69-a191-c7f2f23eebb4
                Copyright © © 1990
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