2
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Characterization Summary for a Radiation Hardened 16KX1 SRAM

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references4

          • Record: found
          • Abstract: not found
          • Article: not found

          Cosmic-Ray-Induced Errors in MOS Devices

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            X-Ray Wafer Probe for Total Dose Testing

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              The Transient Response of Transistors and Diodes to Ionizing Radiation

                Bookmark

                Author and article information

                Journal
                IEEE Transactions on Nuclear Science
                IEEE Trans. Nucl. Sci.
                Institute of Electrical and Electronics Engineers (IEEE)
                0018-9499
                December 1986
                1986
                : 33
                : 6
                : 1535-1540
                Article
                10.1109/TNS.1986.4334637
                9b8c447f-9cef-40d5-99b8-f901f7c4233c
                © 1986
                History

                Comments

                Comment on this article