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      The Effect of Proton Energy on SEU Cross Section of a 16 Mbit TFT PMOS SRAM with DRAM Capacitors

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          Operation of the TRIUMF (20-500 MeV) proton irradiation facility

          E.W. Blackmore (2000)
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            Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

            P E Dodd, J. Schwank, M. Shaneyfelt … (2007)
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              Impacts of front-end and middle-end process modifications on terrestrial soft error rate

              G. Gasiot, P. Roche (2005)
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                Author and article information

                Journal
                Title: IEEE Transactions on Nuclear Science
                Abbreviated Title: IEEE Trans. Nucl. Sci.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9499
                ISSN (Electronic): 1558-1578
                Publication date Created: December 2014
                Publication date (Print): December 2014
                Volume: 61
                Issue: 6
                Pages: 3074-3079
                Article
                DOI: 10.1109/TNS.2014.2368150
                SO-VID: 9cf915e5-5bce-4463-b9d6-7a858b9e7953
                Copyright © © 2014
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