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      Applications of depth-resolved cathodoluminescence spectroscopy

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      Journal: Journal of Physics D: Applied Physics
      Publisher: IOP Publishing

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          Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids

          M. Seah, W. Dench (1979)
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            Correlation between photoluminescence and oxygen vacancies in ZnO phosphors

            K Vanheusden, C. Seager, W Warren … (1996)
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              The structure and properties of metal-semiconductor interfaces

              L. Brillson (1982)
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                Author and article information

                Journal
                Title: Journal of Physics D: Applied Physics
                Abbreviated Title: J. Phys. D: Appl. Phys.
                Publisher: IOP Publishing
                ISSN (Print): 0022-3727
                ISSN (Electronic): 1361-6463
                Publication date Created: May 09 2012
                Publication date (Print): May 09 2012
                Volume: 45
                Issue: 18
                Page: 183001
                Article
                DOI: 10.1088/0022-3727/45/18/183001
                SO-VID: 9d39d77e-c66a-4da7-b59f-0642c439f04f
                Copyright © © 2012
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