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Short cantilevers for atomic force microscopy.
Author(s):
DA Walters
,
JP Cleveland
,
NH Thomson
,
PK Hansma
,
MA Wendman
,
G Gurley
,
V Elings
Publication date:
1996
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Atomic Force Microscopy
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Yang Gan
added an editorial note to
Atomic Force Microscopy
Short cantilevers offer various merits such as enabling higher scanning speed.
2016-02-29 07:39 UTC
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