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      Deposition and imaging of localized charge on insulator surfaces using a force microscope

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      Applied Physics Letters
      AIP Publishing

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          Atomic Force Microscope

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            High‐resolution capacitance measurement and potentiometry by force microscopy

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              Force microscope using a fiber‐optic displacement sensor

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                December 26 1988
                December 26 1988
                : 53
                : 26
                : 2717-2719
                Article
                10.1063/1.100162
                a29c0a50-c87e-4377-932c-a3481ca02e1c
                © 1988
                Product
                Self URI (article page): http://aip.scitation.org/doi/10.1063/1.100162

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