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1,040
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Deposition and imaging of localized charge on insulator surfaces using a force microscope
Author(s):
J. E. Stern
,
B. D. Terris
,
H. J. Mamin
,
D. Rugar
Publication date
Created:
December 26 1988
Publication date
(Print):
December 26 1988
Journal:
Applied Physics Letters
Publisher:
AIP Publishing
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Atomic Force Microscopy
Most cited references
8
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Atomic Force Microscope
G. Binnig
,
C Quate
,
Andreas Gerber
(1987)
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High‐resolution capacitance measurement and potentiometry by force microscopy
Yves Martin
,
H Kumar Wickramasinghe
,
David W. Abraham
(1988)
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Force microscope using a fiber‐optic displacement sensor
J E Stern
,
B. Terris
,
D Rugar
…
(1988)
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Author and article information
Journal
Title:
Applied Physics Letters
Abbreviated Title:
Appl. Phys. Lett.
Publisher:
AIP Publishing
ISSN (Print):
0003-6951
ISSN (Electronic):
1077-3118
Publication date Created:
December 26 1988
Publication date (Print):
December 26 1988
Volume
: 53
Issue
: 26
Pages
: 2717-2719
Article
DOI:
10.1063/1.100162
SO-VID:
a29c0a50-c87e-4377-932c-a3481ca02e1c
Copyright ©
© 1988
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