Deposition and imaging of localized charge on insulator surfaces using a force microscope

Terris, B. D.; Mamin, H J; Rugar, D; Stern, J E

doi:10.1063/1.100162

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Deposition and imaging of localized charge on insulator surfaces using a force microscope

Author(s): J. E. Stern , B. D. Terris , H. J. Mamin , D. Rugar

Publication date Created: December 26 1988

Publication date (Print): December 26 1988

Journal: Applied Physics Letters

Publisher: AIP Publishing

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Atomic Force Microscope

G. Binnig, C Quate, Andreas Gerber (1987)

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High‐resolution capacitance measurement and potentiometry by force microscopy

Yves Martin, H Kumar Wickramasinghe, David W. Abraham (1988)

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Force microscope using a fiber‐optic displacement sensor

J E Stern, B. Terris, D Rugar … (1988)

0 comments Cited 80 times – based on 0 reviews      Review now

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Author and article information

Journal

Title: Applied Physics Letters

Abbreviated Title: Appl. Phys. Lett.

Publisher: AIP Publishing

ISSN (Print): 0003-6951

ISSN (Electronic): 1077-3118

Publication date Created: December 26 1988

Publication date (Print): December 26 1988

Volume: 53

Issue: 26

Pages: 2717-2719

Article

DOI: 10.1063/1.100162

SO-VID: a29c0a50-c87e-4377-932c-a3481ca02e1c

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Self URI (article page): http://aip.scitation.org/doi/10.1063/1.100162

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Deposition and imaging of localized charge on insulator surfaces using a force microscope

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Atomic Force Microscopy

Most cited references 8

Atomic Force Microscope

High‐resolution capacitance measurement and potentiometry by force microscopy

Force microscope using a fiber‐optic displacement sensor

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