X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab

Wiesmann, Jörg; Graf, Jürgen; Hoffmann, Christian; Hembd, Alexandra; Michaelsen, Carsten; Yang, Ning; Cordes, Holger; He, Bob; Preckwinkel, Uwe; Erlacher, Kurt

doi:10.1002/ppsc.200800052

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X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab

Author(s): Jörg Wiesmann , Jürgen Graf , Christian Hoffmann , Alexandra Hembd , Carsten Michaelsen , Ning Yang , Holger Cordes , Bob He , Uwe Preckwinkel , Kurt Erlacher

Publication date Created: September 2009

Publication date (Print): September 2009

Journal: Particle & Particle Systems Characterization

Publisher: Wiley-Blackwell

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Title: Particle & Particle Systems Characterization

Abbreviated Title: Part. Part. Syst. Charact.

Publisher: Wiley-Blackwell

ISSN: 09340866

Publication date Created: September 2009

Publication date (Print): September 2009

Volume: 26

Issue: 3

Pages: 112-116

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DOI: 10.1002/ppsc.200800052

SO-VID: a3a5dd0e-6666-446d-8550-be192d162325

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http://doi.wiley.com/10.1002/tdm_license_1.1

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X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab

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