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      Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

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          Abstract

          A polycapillary-based wavelength-dispersive spectrometer is reported. The design consideration as well as operation characteristics are presented.

          Abstract

          The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the spectrometer are presented. The achieved performances, in particular the energy resolution, are compared with the results of Monte Carlo simulations. Further improvement in the energy resolution, down to ∼eV range, by employing a double-crystal geometry is examined. Finally, examples of applications requiring both spatial and spectral resolutions are presented.

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          Author and article information

          Journal
          J Synchrotron Radiat
          J. Synchrotron Rad.
          Journal of Synchrotron Radiation
          International Union of Crystallography
          0909-0495
          1600-5775
          01 May 2010
          01 April 2010
          01 April 2010
          : 17
          : Pt 3 ( publisher-idID: s100300 )
          : 400-408
          Affiliations
          [a ]European Synchrotron Radiation Facility, Grenoble, France
          [b ]Institute of Physics, Jan Kochanowski University, Kielce, Poland
          [c ]Centre of Research and Restoration of French Museums, UMR171, Paris, France
          [d ]Technology University, Kielce, Poland
          [e ]Department of Physics, University of Fribourg, Fribourg, Switzerland
          Author notes
          Correspondence e-mail: jakub.szlachetko@ 123456esrf.fr
          Article
          ia5057 JSYRES S0909049510010691
          10.1107/S0909049510010691
          3025658
          20400840
          a4d335d8-1011-4e9b-beb0-fcf81db6cc75
          © J. Szlachetko et al. 2010

          This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.

          History
          : 01 March 2010
          : 22 March 2010
          Categories
          Research Papers

          Radiology & Imaging
          x-ray spectroscopy,x-ray imaging,wavelength-dispersive spectrometer
          Radiology & Imaging
          x-ray spectroscopy, x-ray imaging, wavelength-dispersive spectrometer

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