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      Recent advances in X-ray microtomography applied to materials

      International Materials Reviews
      Maney Publishing

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          Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources

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            A new method for the model-independent assessment of thickness in three-dimensional images

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              X-ray phase imaging with a grating interferometer.

              Using a high-efficiency grating interferometer for hard X rays (10-30 keV) and a phase-stepping technique, separate radiographs of the phase and absorption profiles of bulk samples can be obtained from a single set of measurements. Tomographic reconstruction yields quantitative three-dimensional maps of the X-ray refractive index, with a spatial resolution down to a few microns. The method is mechanically robust, requires little spatial coherence and monochromaticity, and can be scaled up to large fields of view, with a detector of correspondingly moderate spatial resolution. These are important prerequisites for use with laboratory X-ray sources.
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                Author and article information

                Journal
                International Materials Reviews
                International Materials Reviews
                Maney Publishing
                0950-6608
                1743-2804
                July 18 2013
                July 18 2013
                : 53
                : 3
                : 129-181
                Article
                10.1179/174328008X277803
                a69f4275-052a-4106-917c-572a8e31942c
                © 2013
                History

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