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      Absolute cross section for DNA damage induced by low-energy (10 eV) electrons: Experimental refinements and sample characterization by AFM

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          Calibration of atomic-force microscope tips

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            Resonant Formation of DNA Strand Breaks by Low-Energy (3 to 20 eV) Electrons

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              Force-distance curves by atomic force microscopy

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                Author and article information

                Affiliations
                [1 ]Department of Nuclear Medicine and Radiobiology, University of Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada
                [2 ]Department of Pharmacology, University of Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada
                Journal
                The Journal of Chemical Physics
                The Journal of Chemical Physics
                AIP Publishing
                0021-9606
                1089-7690
                October 28 2018
                October 28 2018
                : 149
                : 16
                : 164904
                10.1063/1.5041805
                © 2018
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