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Absolute cross section for DNA damage induced by low-energy (10 eV) electrons: Experimental refinements and sample characterization by AFM

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      Calibration of atomic-force microscope tips

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        Resonant Formation of DNA Strand Breaks by Low-Energy (3 to 20 eV) Electrons

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          Force-distance curves by atomic force microscopy

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            Author and article information

            Affiliations
            [1 ]Department of Nuclear Medicine and Radiobiology, University of Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada
            [2 ]Department of Pharmacology, University of Sherbrooke, Sherbrooke, Québec J1K 2R1, Canada
            Journal
            The Journal of Chemical Physics
            The Journal of Chemical Physics
            AIP Publishing
            0021-9606
            1089-7690
            October 28 2018
            October 28 2018
            : 149
            : 16
            : 164904
            10.1063/1.5041805
            © 2018
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