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Physical degradation of a-Si films on thermal treatment a scanning electron microscope study
Author(s):
P. JOHN
,
M. M. ODEH
,
Adrian M. K. Thomas
,
Michael Tricker
,
John Wilson
,
Harbinder Dhariwal
Publication date:
1981
Journal:
J Mater Sci
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NTT Journal for Theology and the Study of Religion
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DOI::
10.1007/BF01033846
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