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      A Survey of Fault Diagnosis and Fault-Tolerant Techniques—Part I: Fault Diagnosis With Model-Based and Signal-Based Approaches

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          Journal
          Title: IEEE Transactions on Industrial Electronics
          Abbreviated Title: IEEE Trans. Ind. Electron.
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 0278-0046
          ISSN (Electronic): 1557-9948
          Publication date Created: June 2015
          Publication date (Print): June 2015
          Volume: 62
          Issue: 6
          Pages: 3757-3767
          Article
          DOI: 10.1109/TIE.2015.2417501
          SO-VID: a90d5e14-2edf-4f40-a3c5-af1f267e1a53
          Copyright © © 2015
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