Fault tolerant 92160 bit multiphase CCD memory

Kohyama, S; Elmer, B.; Hirabayashi, K.; Nojima, I.; Denboer, A.; Tchon, W.

doi:10.1109/ISSCC.1977.1155685

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Fault tolerant 92160 bit multiphase CCD memory

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Author(s): B. Elmer , W. Tchon , A. Denboer , S. Kohyama , K. Hirabayashi , I. Nojima

Publication date (Print): 1977

Conference name: 1977 IEEE International Solid-State Circuits Conference

Conference date: March 16, 1977 - March 18, 1977

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Publication date (Print): 1977

Pages: 116-117

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DOI: 10.1109/ISSCC.1977.1155685

SO-VID: a99121c8-fea7-40ee-893a-fce99ba23dd7

Conference name: 1977 IEEE International Solid-State Circuits Conference

Conference location: Philadelphia, PA, USA

Conference date: March 16, 1977 - March 18, 1977

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Fault tolerant 92160 bit multiphase CCD memory

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