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      Coverage based test-case generation using model checkers

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      Author(s): ,
      Publication date:
      Conference name: Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer Based Systems-ECBS 2001 (ECBS-01)
      Conference date: 17-20 April 2001

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          Conference
          Publication date: 2001
          Pages: 83-91
          Article
          DOI: 10.1109/ECBS.2001.922409
          SO-VID: aa74313b-c3a0-4104-91d6-8a583ce88e05
          Conference name: Eighth Annual IEEE International Conference and Workshop On the Engineering of Computer Based Systems-ECBS 2001
          Conference acronym: ECBS-01
          Conference location: Washington, DC, USA
          Conference date: 17-20 April 2001
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