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      Iddq test: sensitivity analysis of scaling

      proceedings-article
      Author(s): , , , ,
      Publication date:
      Publisher: Int. Test Conference
      Conference name: International Test Conference 1996. Test and Design Validity (TEST-96)
      Conference date: 20-25 Oct. 1996

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          Conference
          Publisher: Int. Test Conference
          Publication date: 1996
          Pages: 786-792
          Article
          DOI: 10.1109/TEST.1996.557138
          SO-VID: ab14c8ae-1a23-4485-a006-414448fb7d1c
          Conference name: International Test Conference 1996. Test and Design Validity
          Conference acronym: TEST-96
          Conference location: Washington, DC, USA
          Conference date: 20-25 Oct. 1996
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