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      Stress modulated photoelectrochemical spectroscopy

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      Journal of Applied Physics
      AIP Publishing

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          Electroreflectance at a Semiconductor-Electrolyte Interface

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            Interband transitions of semiconducting oxides determined from photoelectrolysis spectra

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              Semiconductor Electrodes: XXIII . The Determination of Flatband Potentials from Differential Stress Measurements with Attached Piezoelectric Detectors

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                June 1982
                June 1982
                : 53
                : 6
                : 4549-4552
                Article
                10.1063/1.331203
                ac35a252-4a6a-40fc-8313-ae72ab034d8f
                © 1982
                History

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