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Noncontact potentiometry of polymer field-effect transistors
Author(s):
L. Bürgi
,
H. Sirringhaus
,
R. H. Friend
Publication date
Created:
April 22 2002
Publication date
(Print):
April 22 2002
Journal:
Applied Physics Letters
Publisher:
AIP Publishing
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11
Record
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Kelvin probe force microscopy
H. Wickramasinghe
,
M Nonnenmacher
,
M. P. O’Boyle
(1991)
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High‐resolution capacitance measurement and potentiometry by force microscopy
Yves Martin
,
H Kumar Wickramasinghe
,
David W. Abraham
(1988)
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High-performance all-polymer integrated circuits
D. de Leeuw
,
G H Gelinck
,
T Geuns
(2000)
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Author and article information
Journal
Title:
Applied Physics Letters
Abbreviated Title:
Appl. Phys. Lett.
Publisher:
AIP Publishing
ISSN (Print):
0003-6951
ISSN (Electronic):
1077-3118
Publication date Created:
April 22 2002
Publication date (Print):
April 22 2002
Volume
: 80
Issue
: 16
Pages
: 2913-2915
Article
DOI:
10.1063/1.1470702
SO-VID:
acfa9971-58db-4a5b-972d-20091f558b66
Copyright ©
© 2002
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