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      Noncontact potentiometry of polymer field-effect transistors

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      Applied Physics Letters
      AIP Publishing

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          Kelvin probe force microscopy

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            High‐resolution capacitance measurement and potentiometry by force microscopy

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              High-performance all-polymer integrated circuits

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                April 22 2002
                April 22 2002
                : 80
                : 16
                : 2913-2915
                Article
                10.1063/1.1470702
                acfa9971-58db-4a5b-972d-20091f558b66
                © 2002
                History

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