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    Appl Phys Lett

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        Journal
        10.1063/1.103950

        Nanomaterials, Materials science

        Comments

        added an editorial note to Atomic Force Microscopy

        Scince then, otpical-beam-deflection technique (patented?) prevails in almost every commercial desktop AFM!

        2016-02-29 07:54 UTC
        +1

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