ScienceOpen:
research and publishing network
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
My ScienceOpen
Sign in
Register
Dashboard
Blog
About
Search
Advanced search
My ScienceOpen
Sign in
Register
Dashboard
Search
Search
Advanced search
For Publishers
Discovery
Metadata
Peer review
Hosting
Publishing
For Researchers
Join
Publish
Review
Collect
Blog
About
2
views
0
references
Top references
cited by
3
0 reviews
Review
0
comments
Comment
0
recommends
+1
Recommend
0
collections
Add to
0
shares
Share
Twitter
Sina Weibo
Facebook
Email
1,627
similar
All similar
Record
: found
Abstract
: not found
Article
: not found
Trap Generation Induced by Local Distortion in Amorphous Silicon Dioxide Film
Author(s):
Chioko Kaneta
Publication date:
1996
Journal:
Jpn. J. Appl. Phys.
Read this article at
ScienceOpen
Publisher
Bookmark
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Global Health Next Generation Network
Author and article information
Journal
DOI::
10.1143/JJAP.35.1540
Data availability:
Comments
Comment on this article
Sign in to comment
scite_
Similar content
1,627
Shallow and Deep Trap State Passivation for Low-Temperature Processed Perovskite Solar Cells
Authors:
Randi Azmi
,
Naufan Nurrosyid
,
Sang-Hak Lee
…
Structure and bonding in amorphous iron carbide thin films.
Authors:
Andrej Furlan
,
Ulf Jansson
,
Jun Lu
…
A novel FoxD3 gene trap line reveals neural crest precursor movement and a role for FoxD3 in their specification.
Authors:
Tatiana Hochgreb
,
Marianne E. Bronner
See all similar
Cited by
3
Mechanism of time-dependent oxide breakdown in thin thermally grown SiO2 films
Authors:
Hiroshi Koyama
,
Mikihiro Kimura
Fictive-temperature-dependence of photoinduced self-trapped holes in\(a-{\mathrm{SiO}}_{2}\)
Authors:
M Yamaguchi
,
K Saito
,
A. Ikushima
Fluorine-doping concentration and fictive temperature dependence of self-trapped holes in SiO2 glasses
Authors:
N. Tai
,
A. Ikushima
,
R. -P. Wang
…
See all cited by