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      The qPlus sensor, a powerful core for the atomic force microscope

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      Review of Scientific Instruments
      AIP Publishing

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          Is Open Access

          Topological Insulators

          , (2011)
          Topological insulators are electronic materials that have a bulk band gap like an ordinary insulator, but have protected conducting states on their edge or surface. The 2D topological insulator is a quantum spin Hall insulator, which is a close cousin of the integer quantum Hall state. A 3D topological insulator supports novel spin polarized 2D Dirac fermions on its surface. In this Colloquium article we will review the theoretical foundation for these electronic states and describe recent experiments in which their signatures have been observed. We will describe transport experiments on HgCdTe quantum wells that demonstrate the existence of the edge states predicted for the quantum spin Hall insulator. We will then discuss experiments on Bi_{1-x}Sb_x, Bi_2 Se_3, Bi_2 Te_3 and Sb_2 Te_3 that establish these materials as 3D topological insulators and directly probe the topology of their surface states. We will then describe exotic states that can occur at the surface of a 3D topological insulator due to an induced energy gap. A magnetic gap leads to a novel quantum Hall state that gives rise to a topological magnetoelectric effect. A superconducting energy gap leads to a state that supports Majorana fermions, and may provide a new venue for realizing proposals for topological quantum computation. We will close by discussing prospects for observing these exotic states, a well as other potential device applications of topological insulators.
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            Atomic Force Microscope

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              WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

              In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.

                Author and article information

                Journal
                Review of Scientific Instruments
                Review of Scientific Instruments
                AIP Publishing
                0034-6748
                1089-7623
                January 2019
                January 2019
                : 90
                : 1
                : 011101
                Affiliations
                [1 ]Institute of Experimental and Applied Physics, University of Regensburg, Universitätsstrasse 31, D-93040 Regensburg, Germany
                Article
                10.1063/1.5052264
                30709191
                b1235f9e-8710-4c23-9ce8-d04bcf745ccd
                © 2019
                History

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