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Kelvin probe force microscopy and its application
Author(s):
Wilhelm Melitz
,
Jian Shen
,
Andrew C. Kummel
,
Sangyeob Lee
Publication date
Created:
January 2011
Publication date
(Print):
January 2011
Journal:
Surface Science Reports
Publisher:
Elsevier BV
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There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
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Atomic Force Microscopy
Author and article information
Journal
Title:
Surface Science Reports
Abbreviated Title:
Surface Science Reports
Publisher:
Elsevier BV
ISSN (Print):
01675729
Publication date Created:
January 2011
Publication date (Print):
January 2011
Volume
: 66
Issue
: 1
Pages
: 1-27
Article
DOI:
10.1016/j.surfrep.2010.10.001
SO-VID:
b2cd3caf-fd0f-4204-a136-a0d4dc7a633d
Copyright ©
© 2011
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