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      Asymmetries in dislocation densities, surface morphology, and strain of GaInAs/GaAs single heterolayers

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          Ion beam crystallography of surfaces and interfaces

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            Generation of misfit dislocations in semiconductors

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              Variation of the critical layer thickness with In content in strained InxGa1−xAs‐GaAs quantum wells grown by molecular beam epitaxy

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                November 15 1988
                November 15 1988
                : 64
                : 10
                : 4843-4852
                Article
                10.1063/1.341232
                b3319694-852d-4dbc-8792-f7ef909458fb
                © 1988
                History

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