24
views
0
recommends
+1 Recommend
1 collections
    0
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast

      Microscopy Research and Technique
      Wiley

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references3

          • Record: found
          • Abstract: not found
          • Article: not found

          A factor to predict microcrack nucleation at γ–γ grain boundaries in TiAl

          B SIMKIN (2003)
            Bookmark
            • Record: found
            • Abstract: found
            • Article: not found

            Decoherence in electron backscattering by kinked dislocations

            A model is proposed that explains the origin of the bright contrast of dislocation walls consisting of edge dislocation dipoles in electron channelling contrast images (ECCI) of fatigued crystals, when the incident beam is parallel to the edge dislocations. The model is based on the assumption that the contrast arises from the dislocation segments terminating the dipoles. These are modelled as screw-type kinks which scatter electrons. Scattering by randomly distributed kinks leads to the randomization of phase of transmitted and diffracted beams and suppresses the anomalous transmission of electrons. The predicted behaviour of electron-channeling contrast images agrees well with experimental observations.
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Electron Channelling Contrast Imaging (ECCI) of Dislocations in Bulk Specimens

                Bookmark

                Author and article information

                Journal
                Microscopy Research and Technique
                Microsc. Res. Tech.
                Wiley
                1059-910X
                1097-0029
                May 2006
                May 2006
                2006
                : 69
                : 5
                : 374-381
                Article
                10.1002/jemt.20293
                b37178f6-41f8-4d3b-b342-ae75fd024424
                © 2006

                http://doi.wiley.com/10.1002/tdm_license_1.1

                History

                Comments

                Comment on this article