Blog
About

  • Record: found
  • Abstract: not found
  • Article: not found

Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films

Read this article at

ScienceOpenPublisher
Bookmark
      There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

      Related collections

      Author and article information

      Journal
      Applied Physics Letters
      Appl. Phys. Lett.
      AIP Publishing
      0003-6951
      1077-3118
      January 29 1996
      January 29 1996
      : 68
      : 5
      : 643-645
      10.1063/1.116495
      © 1996
      Product

      Comments

      Comment on this article