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      Electromigration in fine‐line sputter‐gun Al

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      Journal of Applied Physics

      AIP Publishing

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          Most cited references 6

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          Electromigration Damage in Aluminum Film Conductors

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            Dependence of Electromigration‐Induced Failure Time on Length and Width of Aluminum Thin‐Film Conductors

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              Electromigration and crevice formation in thin metallic films

               I.A. Blech (1972)
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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                August 1980
                August 1980
                : 51
                : 8
                : 4475-4482
                10.1063/1.328269
                © 1980
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