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      • Record: found
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      Electromigration in fine‐line sputter‐gun Al

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: Journal of Applied Physics
      Publisher: AIP Publishing

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          Electromigration Damage in Aluminum Film Conductors

          M. Attardo, R. Rosenberg (1970)
          Article 0 comments Cited 75 times – based on 0 reviews     Review now
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            Dependence of Electromigration‐Induced Failure Time on Length and Width of Aluminum Thin‐Film Conductors

            B. N. Agarwala, M. Attardo, A. P. Ingraham (1970)
            Article 0 comments Cited 39 times – based on 0 reviews     Review now
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              Electromigration and crevice formation in thin metallic films

              I.A. Blech (1972)
              Article 0 comments Cited 14 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Applied Physics
                Abbreviated Title: Journal of Applied Physics
                Publisher: AIP Publishing
                ISSN (Print): 0021-8979
                ISSN (Electronic): 1089-7550
                Publication date Created: August 1980
                Publication date (Print): August 1980
                Volume: 51
                Issue: 8
                Pages: 4475-4482
                Article
                DOI: 10.1063/1.328269
                SO-VID: b7984052-3018-4d84-a192-4355d6fc32e8
                Copyright © © 1980
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