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Electromigration in fine‐line sputter‐gun Al

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Journal of Applied Physics

AIP Publishing

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      Most cited references 6

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      Electromigration Damage in Aluminum Film Conductors

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        Dependence of Electromigration‐Induced Failure Time on Length and Width of Aluminum Thin‐Film Conductors

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          Electromigration and crevice formation in thin metallic films

           I.A. Blech (1972)
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            Author and article information

            Journal
            Journal of Applied Physics
            Journal of Applied Physics
            AIP Publishing
            0021-8979
            1089-7550
            August 1980
            August 1980
            : 51
            : 8
            : 4475-4482
            10.1063/1.328269
            © 1980
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