For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
6
views
19
references
 Top references
cited by
1
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      1,303
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references19

          • Record: found
          • Abstract: not found
          • Article: not found

          Radiation-induced soft errors in advanced semiconductor technologies

          R.C. Baumann (2005)
          Article 0 comments Cited 58 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Conference Proceedings: not found

            MiBench: A free, commercially representative embedded benchmark suite

            M.R. Guthaus, J.S. Ringenberg, D. Ernst … (2001)
            Article 0 comments Cited 37 times – based on 0 reviews
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection

              R. Ecoffet, S. Rezgui, R Velazco (2000)
              Article 0 comments Cited 13 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: IEEE Transactions on Nuclear Science
                Abbreviated Title: IEEE Trans. Nucl. Sci.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9499
                ISSN (Electronic): 1558-1578
                Publication date Created: August 2018
                Publication date (Print): August 2018
                Volume: 65
                Issue: 8
                Pages: 1783-1790
                Article
                DOI: 10.1109/TNS.2018.2852606
                SO-VID: b9e57b54-bc50-4290-ac73-b96594825d8e
                Copyright © © 2018
                History

                Data availability:

                Comments

                Comment on this article