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      Defect structure of metal‐organic chemical vapor deposition‐grown epitaxial (0001) GaN/Al2O3

      , , , , , ,
      Journal of Applied Physics
      AIP Publishing

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          InGaN-Based Multi-Quantum-Well-Structure Laser Diodes

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            High dislocation densities in high efficiency GaN‐based light‐emitting diodes

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              Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                September 15 1996
                September 15 1996
                : 80
                : 6
                : 3228-3237
                Article
                10.1063/1.363264
                b9e5a572-5420-4f33-b04a-8dcefbb8aa06
                © 1996
                History

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