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      Nonuniform Nanowire Doping Profiles Revealed by Quantitative Scanning Photocurrent Microscopy

      , , ,  
      Advanced Materials
      Wiley

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          Direct measurement of dopant distribution in an individual vapour-liquid-solid nanowire.

          Semiconductor nanowires show promise for many device applications, but controlled doping with electronic and magnetic impurities remains an important challenge. Limitations on dopant incorporation have been identified in nanocrystals, raising concerns about the prospects for doping nanostructures. Progress has been hindered by the lack of a method to quantify the dopant distribution in single nanostructures. Recently, we showed that atom probe tomography can be used to determine the composition of isolated nanowires. Here, we report the first direct measurements of dopant concentrations in arbitrary regions of individual nanowires. We find that differences in precursor decomposition rates between the liquid catalyst and solid nanowire surface give rise to a heavily doped shell surrounding an underdoped core. We also present a thermodynamic model that relates liquid and solid compositions to dopant fluxes.
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            Author and article information

            Journal
            ADMA
            Advanced Materials
            Adv. Mater.
            Wiley
            09359648
            15214095
            August 14 2009
            August 14 2009
            : 21
            : 30
            : 3067-3072
            Article
            10.1002/adma.200803865
            bc35d8d0-e0ed-47eb-9f3f-913cdac993ce
            © 2009

            http://doi.wiley.com/10.1002/tdm_license_1.1

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            Self URI (article page): http://doi.wiley.com/10.1002/adma.200803865

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