27
views
0
recommends
+1 Recommend
1 collections
    1
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Detection of small delamination in mullite/Si/SiC model EBC system by pulse thermography

      research-article

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          The pulse thermography (PT) technique was applied to the detection of the delamination of a multi-layered coating system composed of mullite/Si onto a reaction-bonded SiC substrate. The potential evaluation was carried out in order to detect internal delamination in multi-layered material system. Moreover, the observation of the cross sections and 3D views obtained by X-ray computed tomography (CT) indicated that the delamination occurred at the interface between the top coat and the bond coat layers. The changes in the temperature distribution obtained by PT indicated the existence of a delamination area in the top coat layer of the mullite. In particular, the lower temperature region corresponded to the delamination area. The experimental results confirmed that the PT technique is effective with respect to the internal delamination of multi-layered coating system.

          Related collections

          Author and article information

          Journal
          J Adv Ceram
          Journal of Advanced Ceramics
          Tsinghua University Press and Springer-Verlag Berlin Heidelberg (USA )
          2227-8508
          2226-4108
          01 September 2019
          01 October 2019
          : 8
          : 3
          : 438-447
          Affiliations
          aDepartment of Materials Science and Technology, Tokyo University of Science, 6-3-1, Niijyuku, Katsushika-ku, Tokyo, 125-8585, Japan
          bDepartment of Mechanical Engineering, Tokyo University of Science, 6-3-1, Niijyuku, Katsushika-ku, Tokyo, 125-8585, Japan
          Author notes
          *Corresponding author: Ryo INOUE, E-mail: inoue.ryo@ 123456rs.tus.ac.jp
          Article
          s40145-019-0327-3
          10.1007/s40145-019-0327-3
          Copyright © The Author(s)

          This is an open-access article distributed under the terms of the Creative Commons Attribution 4.0 International License (CC BY 4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. See https://creativecommons.org/licenses/by/4.0/.

          Categories
          Research Article

          Comments

          Comment on this article