Coverage directed test generation for functional verification using bayesian networks

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Publisher: ACM

Publication date (Print): June 02 2003

Publication date (Online): June 02 2003

Publication date (Print): June 02 2003

Publication date (Electronic): June 02 2003

Pages: 286-291

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[1 ]IBM Research Laboratory in Haifa, Haifa, Israel

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DOI: 10.1145/775832.775907

SO-VID: be04363a-84fc-48a7-b39c-674e527f9fae

Conference name: DAC03: 2003 40th Annual Design Automation Conference

Conference acronym: DAC03

Conference location: Anaheim CA USA

Conference date: 02 06 2003 06 06 2003

Conference sponsor: SIGDA ACM Special Interest Group on Design Automation

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Coverage directed test generation for functional verification using bayesian networks

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