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      On the depth resolution of transmission Kikuchi diffraction (TKD) analysis

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          Abstract

          In this paper, we have analysed the depth resolution that can be achieved by on-axis transmission Kikuchi diffraction (TKD) using a Zr-Nb alloy. The results indicate that the signals contributing to detectable Kikuchi bands originate from a depth of approximately the mean free path of thermal diffuse scattering (lambdaTDS) from the bottom surface of a thin foil sample. This existing surface sensitivity can thus lead to the observation of different grain structures when opposite sides of a nano-crystalline foil are facing the incident electron beam. These results also provide a guideline for the ideal sample thickness for TKD analysis of 6lambdaTDS, or 21 times the elastic scattering mean free path (lambdaMFP) for samples of high crystal symmetry. For samples of lower symmetry, a smaller thickness 3lambdaTDS, or 10lambdaMFP is suggested.

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          Most cited references 19

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          Transmission EBSD from 10 nm domains in a scanning electron microscope

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            Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

             D. Dingley (2004)
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              Strains, planes, and EBSD in materials science

              Author Summary: Electron back scatter diffraction (EBSD) has made an impressive impact on the characterization of materials by directly linking microstructure and crystallographic texture to provide very rich and quantitative datasets which in many instances have forced us to rethink how microstructure should be defined and analyzed. In this article we try to first give a very basic idea of how an EBSD map is obtained and what the data produced is like. We then give a brief history detailing some of the more major steps in developing the technique to what it is today. Finally, we explore two advanced and exciting technique areas of strain mapping and 3D microscopy and demonstrate how the EBSD technique continues to evolve to tackle new applications and bolster our materials characterization toolbox.
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                Author and article information

                Journal
                08 April 2019
                Article
                1904.04140

                http://arxiv.org/licenses/nonexclusive-distrib/1.0/

                Custom metadata
                cond-mat.mtrl-sci

                Condensed matter

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