For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
2
views
10
references
 Top references
cited by
3
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      2,066
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Determination of diffusion length of electron beam induced minority carriers in polycrystalline GaAs

      Author(s): ,
      Publication date Created:
      Publication date (Print):
      Journal: Applied Physics Letters
      Publisher: AIP Publishing

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references10

          • Record: found
          • Abstract: not found
          • Article: not found

          Theory of life time measurements with the scanning electron microscope: Steady state

          F. Berz, H.K. Kuiken (1976)
          Article 0 comments Cited 68 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Measurement of Diffusion Lengths in Direct‐Gap Semiconductors by Electron‐Beam Excitation

            David Kyser, David Wittry (1967)
            Article 0 comments Cited 66 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Investigation of minority‐carrier diffusion lengths by electron bombardment of Schottky barriers

              D. Wittry, C. Wu (1978)
              Article 0 comments Cited 60 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: Applied Physics Letters
                Abbreviated Title: Appl. Phys. Lett.
                Publisher: AIP Publishing
                ISSN (Print): 0003-6951
                ISSN (Electronic): 1077-3118
                Publication date Created: June 1983
                Publication date (Print): June 1983
                Volume: 42
                Issue: 11
                Pages: 958-960
                Article
                DOI: 10.1063/1.93813
                SO-VID: be7c9bab-5b9d-45d2-91e4-a1d1e398f003
                Copyright © © 1983
                History

                Data availability:

                Comments

                Comment on this article

                scite_

                Similar content2,066

                See all similar

                Cited by3

                See all cited by

                Most referenced authors42

                See all reference authors