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      Kelvin probe force microscopy

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      Applied Physics Letters

      AIP Publishing

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          Most cited references 12

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          Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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            High‐resolution capacitance measurement and potentiometry by force microscopy

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              Deposition and imaging of localized charge on insulator surfaces using a force microscope

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                June 24 1991
                June 24 1991
                : 58
                : 25
                : 2921-2923
                Article
                10.1063/1.105227
                © 1991
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