Dislocation analysis of a complex sub-grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scanning electron microscope

Mansour, H.; Crimp, M.A.; Gey, N.; Iltis, X.; Maloufi, N.

doi:10.1016/j.ceramint.2019.06.091

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Dislocation analysis of a complex sub-grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scanning electron microscope

Author(s): H. Mansour , M.A. Crimp , N. Gey , X. Iltis , N. Maloufi

Publication date Created: June 2019

Publication date (Print): June 2019

Journal: Ceramics International

Publisher: Elsevier BV

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Title: Ceramics International

Abbreviated Title: Ceramics International

Publisher: Elsevier BV

ISSN (Print): 02728842

Publication date Created: June 2019

Publication date (Print): June 2019

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DOI: 10.1016/j.ceramint.2019.06.091

SO-VID: bfc61d57-27a6-41f0-aa09-58a36f4cc22b

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Dislocation analysis of a complex sub-grain boundary in UO2 ceramic using accurate electron channelling contrast imaging in a scanning electron microscope

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Electron Channelling Contrast Imaging (ECCI)

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