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      Double-junction effect in proton-irradiated silicon diodes

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      Journal of Applied Physics
      AIP Publishing

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          Radiation hardness of silicon detectors – a challenge from high-energy physics

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            A self consistent approach to IV-measurements on rectifying metal-semiconductor contacts

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              Imaging of high field regions in semi-insulating GaAs under bias

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                August 15 2002
                August 15 2002
                : 92
                : 4
                : 2013-2016
                Article
                10.1063/1.1495077
                c061a9ef-cff5-4cd0-a78a-6f099a06d4e1
                © 2002
                History

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