Author(s):
J. Yamada ,
T. Miwa ,
H. Koike ,
H. Toyoshima ,
K. Amanuma ,
S. Kobayashi ,
T. Tatsumi ,
Y. Maejima ,
H. Hada ,
H. Mori ,
S. Takahashi ,
H. Takeuchi ,
T. Kunio
Publication date:
2000
Conference name: 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (ISSCC-00)
Conference date: 7-9 Feb. 2000