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      Spatially resolved Raman spectroscopy of single- and few-layer graphene.

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          Abstract

          We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.

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          Author and article information

          Journal
          Nano Lett
          Nano letters
          American Chemical Society (ACS)
          1530-6984
          1530-6984
          Feb 2007
          : 7
          : 2
          Affiliations
          [1 ] Solid State Physics Laboratory, ETH Zurich, 8093 Zurich, Switzerland. grafdavy@phys.ethz.ch
          Article
          10.1021/nl061702a
          17297984
          c430ea0e-0eb4-4242-b106-788adeb8410f
          History

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