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Optical characterization of 4H-SiC by far ultraviolet spectroscopic ellipsometry
Author(s):
Seung-Gu Lim
,
Thomas N. Jackson
,
W. Mitchel
,
R. Bertke
,
J. Freeouf
Publication date:
2001
Journal:
Applied Physics Letters
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Maandblad voor Accountancy en Bedrijfseconomie (MAB)
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DOI::
10.1063/1.1384895
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