Statistical pattern recognition: a review

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Journal

Title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Abbreviated Title: IEEE Trans. Pattern Anal. Machine Intell.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 01628828

Publication date (Print): Jan. 2000

Volume: 22

Issue: 1

Pages: 4-37

Article

DOI: 10.1109/34.824819

SO-VID: c4f33e19-bad2-4564-8801-f2146c958cf1

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