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Demonstration of the g · b x u = 0 edge dislocation invisibility criterion for electron channelling contrast imaging

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Philosophical Magazine Letters

Informa UK Limited

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      Transmission Electron Microscopy

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        A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons

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          Electron channelling contrast imaging of interfacial defects in strained silicon-germanium layers on silicon

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            Author and article information

            Journal
            Philosophical Magazine Letters
            Philosophical Magazine Letters
            Informa UK Limited
            0950-0839
            1362-3036
            November 14 2010
            December 2001
            November 14 2010
            December 2001
            : 81
            : 12
            : 833-837
            10.1080/09500830110088755
            © 2001

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